Ai-760

Teradyne’s Ai-760 analog test instrument allows systems integrators to create powerful, mixed-signal test solutions that yield lower costs for test systems and test programs. The Ai-760 is a standards-based analog test instrument that provides high-performance and flexibility for Defense and Aerospace test applications. The Ai-760 combines legacy functionality with advanced, parallel test capabilities. This powerful combination of features makes the Ai-760 the ideal analog test instrument for re-hosting existing test program set investment as well as capture the benefits of operational test.

As with all instruments in Teradyne’s Core Systems Instrumentation family, the Ai-760 combines greater levels of functionality and high-performance in a small form factor. The Ai-760 consolidates source and measurement instruments and provides solid coordination of analog subsystem test functions. With parallel source and measure capability to implement operational test of units under test and to increase TPS throughput, the Ai-760 is perfect for reducing test costs and test time while increasing test coverage. This combination of functional density and unified control of multiple instruments enables system integrators to decrease tester footprint and increase test performance.